The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

Jan. 09, 2008
Applicant:

Faquir C Jain, Storrs, CT (US);

Inventor:

Faquir C Jain, Storrs, CT (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/76 (2006.01); H01L 29/788 (2006.01); B82Y 10/00 (2011.01); H01L 21/28 (2006.01); H01L 29/10 (2006.01); H01L 29/12 (2006.01); H01L 29/165 (2006.01); H01L 29/423 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7881 (2013.01); B82Y 10/00 (2013.01); H01L 21/28273 (2013.01); H01L 29/1054 (2013.01); H01L 29/122 (2013.01); H01L 29/165 (2013.01); H01L 29/42332 (2013.01);
Abstract

The present invention discloses structures and method of fabricating cladded quantum dot gate nonvolatile memory and three-state field-effect transistor devices that can be scaled down to sub-22 nm dimensions and embedded along side with other functional circuits. Another innovation is the design of transport channel, which comprises an asymmetric coupled well structure comprising two or more wells. This structure enhances the retention time in nonvolatile memory by increasing the effective separation between channel charge and the quantum dots located in the floating gate. The cladded quantum dot gate FETs can be designed in Si, InGaAs—InP and other material systems. The 3-state FET devices form the basis of novel digital circuits using multiple valued logic and advanced analog circuits. One or more layers of SiO-cladded Si quantum dots can also be used as high-k dielectric layer forming the gate insulator over the transport channel of a sub-22 nm FET.


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