The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

Jan. 25, 2013
Applicant:

Jx Nippon Mining & Metals Corporation, Tokyo, JP;

Inventors:

Yoshitaka Shibuya, Ibaraki, JP;

Kazuhiko Fukamachi, Ibaraki, JP;

Atsushi Kodama, Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R 13/03 (2006.01); H01B 1/02 (2006.01); C23C 14/14 (2006.01); C22C 5/04 (2006.01); C22C 5/06 (2006.01); C22C 13/00 (2006.01); C22C 19/03 (2006.01); C23C 28/02 (2006.01); B32B 15/01 (2006.01); H01R 4/58 (2006.01); C23C 10/28 (2006.01); C23C 10/60 (2006.01); C23C 14/58 (2006.01); H05K 1/09 (2006.01); H05K 3/24 (2006.01);
U.S. Cl.
CPC ...
H01B 1/02 (2013.01); B32B 15/01 (2013.01); B32B 15/018 (2013.01); C22C 5/04 (2013.01); C22C 5/06 (2013.01); C22C 13/00 (2013.01); C22C 19/03 (2013.01); C23C 10/28 (2013.01); C23C 10/60 (2013.01); C23C 14/14 (2013.01); C23C 14/58 (2013.01); C23C 28/021 (2013.01); H01R 4/58 (2013.01); H01R 13/03 (2013.01); H05K 1/09 (2013.01); H05K 3/244 (2013.01); Y10T 428/12681 (2015.01); Y10T 428/12708 (2015.01); Y10T 428/12715 (2015.01); Y10T 428/12722 (2015.01);
Abstract

The present invention provides a metallic material for electronic components having a low degree of whisker formation and a high durability, and connector terminals, connectors and electronic components using the metallic material. The metallic material for electronic components includes: a base material; on the base material, an lower layer constituted with one or two or more selected from the group consisting of Ni, Cr, Mn, Fe, Co and Cu; on the lower layer, an upper layer constituted with an alloy composed of one or both of Sn and In (constituent elements A) and one or two or more of Ag, Au, Pt, Pd, Ru, Rh, Os and Ir (constituent elements B), wherein the thickness of the lower layer is 0.05 μm or more; the thickness of the upper layer is 0.005 μm or more and 0.6 μm or less; and in the upper layer, the relation between the ratio, the constituent elements A/(the constituent elements A+the constituent elements B) [mass %] (hereinafter, referred to as the proportion of Sn+In) and the plating thickness [μm] is given byplating thickness≦8.2×(proportion of Sn+In)[herein, (the proportion of Sn+In)≧10 mass %].


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Shibuya, Yoshitaka. (2016). Metallic material for electronic components, and connector terminals, connectors and electronic components using same (U.S. Patent No. 9330804). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9330804

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