The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2016
Filed:
Jun. 22, 2013
Varian Medical Systems, Inc., Palo Alto, CA (US);
Josh Star-Lack, Palo Alto, CA (US);
Mingshan Sun, Menlo Park, CA (US);
VARIAN MEDICAL SYSTEMS, INC., Palo Alto, CA (US);
Abstract
Techniques described herein generally relate to estimating scatter. In one embodiment, one example method for estimating scatter associated with a target object may include generating a set of original projections associated with the target object, generating a set of reference scatter data associated with the target object at one or more selected projection angles, generating a first set of estimated scatter data associated with the target object also at the one or more selected projection angles, adjusting first values for one or more kernel parameters of one or more kernels that reduce a difference between the set of reference scatter data and the first set of estimated scatter data, interpolating the adjusted first values for remaining projections out of the set of original projections to generate second values for the one or more kernel parameters, and generating a second set of estimated scatter data associated with the target object.