The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

May. 15, 2013
Applicant:

Microsoft Corporation, Redmond, WA (US);

Inventors:

Mikhail Bilenko, Bellevue, WA (US);

Alice Zheng, Seattle, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 99/00 (2010.01); G06N 7/00 (2006.01); G06N 5/02 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06K 9/6256 (2013.01); G06K 9/6269 (2013.01); G06N 5/025 (2013.01); G06N 7/005 (2013.01);
Abstract

Technologies pertaining to tuning a hyper-parameter configuration of a learning algorithm are described. The learning algorithm learns parameters of a predictive model based upon the hyper-parameter configuration. Candidate hyper-parameter configurations are identified, and statistical hypothesis tests are undertaken over respective pairs of candidate hyper-parameter configurations to identify, for each pair of candidate hyper-parameter configurations, which of the two configurations is associated with better predictive performance. The technologies described herein take into consideration the stochastic nature of training data, validation data, and evaluation functions.


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