The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

Apr. 02, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Kyohei Kikuta, Tokyo, JP;

Hideki Kadoi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/46 (2006.01); H04N 1/60 (2006.01); G06K 15/10 (2006.01); G06K 15/02 (2006.01); H04N 1/40 (2006.01);
U.S. Cl.
CPC ...
G06K 15/105 (2013.01); G06K 15/1868 (2013.01); G06K 15/1881 (2013.01); H04N 1/40 (2013.01);
Abstract

An image that is robust against position shift and that has improved graininess is formed. In the embodiments, a halftone processor creates a first dot arrangement and a second dot arrangement from related weighting functions and weighting maps (S, S), evaluates the image quality when the first dot arrangement and the second dot arrangement are overlapped and combined (S, S), updates the weightings for only pixels where a dot is arranged in case where the evaluation results in the evaluating step are not within a specified range (S), obtains a first dot arrangement and a second dot arrangement that were recreated based on the updated weightings (S, S), and repeats steps Sto Suntil it is determined that the change in image quality due to position shift when the recreated first and second dot arrangements are overlapped and combined is within a specified range.


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