The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

Dec. 10, 2013
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

Majid Sarrafzadeh, Anaheim Hills, CA (US);

Wenyao Xu, Rowland Heights, CA (US);

Ming-Chun Huang, Sulver, CA (US);

Jason J. Liu, Los Angeles, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); A61B 5/00 (2006.01); A61B 5/103 (2006.01); A61B 5/11 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6248 (2013.01); A61B 5/0013 (2013.01); A61B 5/1036 (2013.01); A61B 5/1128 (2013.01); A61B 5/6892 (2013.01); G06K 9/00342 (2013.01); A61B 2505/07 (2013.01); A61B 2505/09 (2013.01); A61B 2562/0247 (2013.01);
Abstract

A system includes a pressure sensitive material that provides an indication of applied pressure for multiple locations on the material, and an analysis device in communication with the pressure sensitive material. The analysis device receives the indication of applied pressure, determines, for each of multiple measurement periods, a pressure image from the indication of applied pressure such that a sequence of pressure images is determined, and constructs a manifold representing the sequence of pressure images.


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