The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

May. 05, 2015
Applicant:

Google Inc., Mountain View, CA (US);

Inventors:

Stephen Joseph Diverdi, Oakland, CA (US);

Sevket Derin Babacan, San Francisco, CA (US);

Aravind Krishnaswamy, San Jose, CA (US);

Assignee:

Google Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 11/00 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6202 (2013.01); G06T 5/002 (2013.01); G06T 11/001 (2013.01);
Abstract

Implementations relate to estimating noise in images using a polynomial relationship for pixel values of image features. In some implementations, a computer-implemented method to estimate noise in an image includes determining a plurality of patches of pixels in the image. For each patch of pixels, the method determines feature pixels in the patch that are included in a particular image feature at least partially depicted in the patch. The method determines an error estimate for each patch of pixels, where each error estimate is based on an amount by which pixel values of the feature pixels in the patch of pixels are different from an estimated polynomial relationship between the feature pixels in the patch of pixels. One of the error estimates is selected as a noise level estimate for the image.


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