The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2016
Filed:
Jan. 15, 2014
Mostafa A. Karam, Moorpark, CA (US);
Kent Anderson, Azusa, CA (US);
Raj K. Shori, North Hills, CA (US);
A. Douglas Meyer, Woodland Hills, CA (US);
Mostafa A. Karam, Moorpark, CA (US);
Kent Anderson, Azusa, CA (US);
Raj K. Shori, North Hills, CA (US);
A. Douglas Meyer, Woodland Hills, CA (US);
Northrop Grumman Systems Corporation, Falls Church, VA (US);
Abstract
A detection system includes a polarization analyzer that generates one or more null detection values if an object is sensed in a received millimeter wave (MMW) brightness temperature data set. The polarization analyzer analyzes a polarization parameter in the received MMW brightness temperature data set to generate the one or more null detection values. An object detector detects if the object is present based on a comparison of the one or more null detection values to a predetermined threshold. A singular value decomposition (SVD) unit is enabled by the object detector to decompose the MMW brightness temperature data set into a plurality of image layers. Each image layer includes at least one feature of a scene. An identification unit analyzes the plurality of image layers from the SVD unit to determine a shape or a location of the object from the scene.