The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

Dec. 12, 2013
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Joshua William McFarlane, Seattle, WA (US);

Andrew Thomas Troutman, Seattle, WA (US);

Matthew Roy Noble, Seattle, WA (US);

Nicholas Alexander Allen, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/3664 (2013.01); G06F 11/3668 (2013.01);
Abstract

Technologies are described herein for performing a defect analysis on a software component based upon collected data that describes the operational state of hardware devices in an execution environment utilized to execute the software component at different points in time. The hardware state data is collected from the hardware devices in the execution environment at different points in time and stored in a version control system. A defect analysis may then be performed for an issue identified in the software component utilizing the hardware state data stored in the version control system. Based upon the results of the defect analysis, one or more actions may be taken such as, but not limited to, rolling the hardware or software configuration of one or more of the hardware devices in the execution environment back to a previous point in time.


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