The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

Dec. 30, 2013
Applicant:

Sandisk Technologies Inc., Plano, TX (US);

Inventors:

Neil Richard Darragh, Edinburgh, GB;

Eran Erez, San Jose, CA (US);

Sergey Anatolievich Gorobets, Edinburgh, GB;

Assignee:

SanDisk Technologies Inc., Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G06F 3/06 (2006.01); G11C 16/16 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0653 (2013.01); G06F 3/0616 (2013.01); G06F 3/0679 (2013.01); G11C 16/16 (2013.01); G11C 16/3495 (2013.01); G06F 2212/7211 (2013.01);
Abstract

A method and system are disclosed for improved block erase cycle life prediction and block management in a non-volatile memory. The method includes the storage device tracking information relating to a first erase cycle count at which the block erase time exceeded a predetermined threshold relative to a first erase cycle at which this occurred in other blocks. Blocks having a later relative erase cycle at which the erase time threshold is exceeded are assumed to have a greater erase cycle life than those that need to exceed the erase time threshold at an earlier erase cycle. This information is used to adjust wear leveling in the form of free block selection, garbage collection block selection and other block management processes. Alternatively or in combination, the predicted erase cycle life information is used to adjust program and/or erase parameters such as erase voltage and time.


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