The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2016
Filed:
May. 23, 2012
Mark Spencer Haynes, Bloomfield Hills, MI (US);
Mahta Moghaddam, La Canada, CA (US);
Mark Spencer Haynes, Bloomfield Hills, MI (US);
Mahta Moghaddam, La Canada, CA (US);
The Regents of the University of Michigan, Ann Arbor, MI (US);
Abstract
An imaging system and method in which the system carries out the method which includes the steps of: (a) determining an incident field, (b) using the incident field and a volume integral equation (VIE) to determine a total field, (c) predicting voltage ratio measurement at a receiving antenna by using the volume integral equation (VIE), wherein the VIE includes a vector Green's function, (d) collecting voltage ratio measurements from one or more receiving antennas, and (e) comparing the predicted voltage ratio measurements to the collected voltage ratio measurements to determine one or more properties of the object being evaluated. An S-parameter based inverse scattering method using the vector Green's function and VIE as its core is also described.
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