The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

Aug. 27, 2013
Applicant:

The Texas A&m University System, College Station, TX (US);

Inventor:

Robert S. Balog, College Station, TX (US);

Assignee:

The Texas A&M University System, College Station, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/02 (2006.01); G01R 31/12 (2006.01); H02H 1/00 (2006.01); H02S 50/10 (2014.01); H02H 3/44 (2006.01); H02H 3/46 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G01R 31/02 (2013.01); G01R 31/1227 (2013.01); H02H 1/0015 (2013.01); H02H 3/44 (2013.01); H02H 3/46 (2013.01); H02S 50/10 (2014.12);
Abstract

A method for detecting an arc event occurring in an electrical system includes sensing a voltage using a voltage sensing device coupled to a component of the electrical system, producing a signal waveform representative of the sensed voltage using the voltage sensing device, and sampling at a predetermined frequency the voltage signal waveform to generate a plurality of sample waveforms. The method further includes applying a wavelet transform to each sample waveform to decompose them into a predetermined number of detailed waveforms using a corresponding number of successive wavelet components, dividing each detailed waveform into a plurality of segments, analyzing the plurality of segments to detect a change in one or more of the properties of the corresponding detailed waveform, and determining an occurrence of the arc event based on the duration of the detected change of one or more of characteristics of the corresponding detailed waveform.


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