The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

Jun. 22, 2012
Applicants:

Hiroki Funato, Tokyo, JP;

Takashi Suga, Tokyo, JP;

Inventors:

Hiroki Funato, Tokyo, JP;

Takashi Suga, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 15/14 (2006.01); G01R 15/18 (2006.01);
U.S. Cl.
CPC ...
G01R 15/148 (2013.01); G01R 15/185 (2013.01);
Abstract

A surface current probe includes two current detection coils disposed so as to detect a magnetic field in a direction vertical to an current detection target plane; two disturbance-control coils, each thereof being disposed at a position farther away from each of the two current detection coils, against the current detection target plane, so as to be disposed for detection of a magnetic field in a direction parallel to the current detection target plane; and a terminal resistor coupled to each of the two disturbance-control coils. The two disturbance-control coils are disposed such that induced voltages generated against the current detection target plane at the time of detection of a magnetic field on the outer side of the two current detection coils are opposed in polarity to each other.


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