The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

Sep. 12, 2011
Applicants:

Hiromi Onomichi, Akashi, JP;

Mitsuo Yamasaki, Kobe, JP;

Inventors:

Hiromi Onomichi, Akashi, JP;

Mitsuo Yamasaki, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); G01N 35/10 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0092 (2013.01); G01N 2035/00643 (2013.01); G01N 2035/00891 (2013.01);
Abstract

A sample processing apparatus for performing a process including a plurality of steps on a sample, the sample processing apparatus sequentially processing a plurality of samples, is disclosed. The apparatus comprises a plurality of units corresponding to the respective steps in the process; a transfer section which transfers a sample to the units according to a flow of the steps; and a controller. Specifically, when an operation was not performed successfully, the controller interrupts the process for a sample that had not reached the location where the unsuccessful operation was performed while continuing the process for a sample that had already passed the location, retries the operation that was not performed successfully, and resumes the interrupted process when the retried operation has been performed successfully.


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