The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2016
Filed:
Mar. 12, 2012
Heimo Schnablegger, Graz, AT;
Edith Pieber, Arnoldstein, AT;
Heimo Schnablegger, Graz, AT;
Anton Paar GmbH, Graz-Strassgang, AT;
Abstract
The invention relates to a method and an apparatus for studying the X-ray properties of samples (), wherein X-ray radiation scattered by a sample () is recorded by a detector () positioned at a distance from the sample () and is evaluated with respect to the characteristics of the sample. According to the invention, it is provided that at a predetermined distance between the X-ray beam source () and the detector () or between the starting point () of the X-ray beam () directed at the sample () and the detector (), for a predetermined number of successive measurements the distance (S, S) between the sample () and the detector () is changed and is set at a predetermined different value.