The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2016
Filed:
Mar. 04, 2015
Olympus Corporation, Tokyo, JP;
Ryosuke Ito, Hino, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A scattered light measurement apparatus includes an optical measurement apparatus, and a scattered light measurement probe configured to irradiate an object with light from the optical measurement apparatus, configured to receive light from the object, and configured to output the received light to the optical measurement apparatus. The optical measurement apparatus includes: a light source configured to emit light including at least light of a measurement target wavelength; first and second optical detectors configured to detect the light received by the scattered light measurement probe; a branching unit configured to guide the light from the light source to the scattered light measurement probe and guide the light from the scattered light measurement probe to the first and second optical detectors; and a control unit configured to evaluate scattering characteristics of a surface layer of the object based on the light detected by the first and second optical detectors.