The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

Aug. 25, 2014
Applicants:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Toshiba Medical Systems Corporation, Otawara-shi, JP;

Inventors:

Tadaharu Kobayashi, Otawara, JP;

Kenji Mizutani, Nasushiobara, JP;

Masanori Matsumoto, Nasushiobara, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); A61B 6/12 (2006.01);
U.S. Cl.
CPC ...
A61B 6/542 (2013.01); A61B 6/032 (2013.01); A61B 6/405 (2013.01); A61B 6/4417 (2013.01); A61B 6/4441 (2013.01); A61B 6/545 (2013.01); A61B 6/12 (2013.01); A61B 6/488 (2013.01); A61B 6/503 (2013.01);
Abstract

An X-ray CT apparatus includes a specifying unit, a setting unit, a controller, and a reconstruction unit. The specifying unit refers to exposure dose information to specify a high exposure area in an imaging area in a subject. The setting unit sets a scan condition under which a cross section of the imaging area can be imaged and under which X-rays are not directly applied to the high exposure area or another scan condition under which a cross section of the imaging area can be imaged and under which an X-ray radiation dose directly applied to the high exposure area is reduced relative to an area other than the high exposure area. The controller collects data of X-rays applied from an X-ray tube and detected by an X-ray detector under the set scan condition. The reconstruction unit reconstructs a tomographic image using the collected data of X-rays.


Find Patent Forward Citations

Loading…