The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2016
Filed:
Mar. 26, 2012
Nyan Myo Naing, Singapore, SG;
MD Irwan Bin MD Kassim, Singapore, SG;
Mohamad Sulhede Bin Samsudin, Singapore, SG;
Visit Thaveeprungsriporn, Singapore, SG;
Nyan Myo Naing, Singapore, SG;
Md Irwan Bin Md Kassim, Singapore, SG;
Mohamad Sulhede Bin Samsudin, Singapore, SG;
Visit Thaveeprungsriporn, Singapore, SG;
NITTO DENKO CORPORATION, , JP;
Abstract
A method of measuring an artifact removed photoplethysmographic (PPG) signal and a measurement system for measuring an artifact removed photoplethysmographic (PPG) signal are provided. The method comprises obtaining a first set of PPG signals from a plurality of detectors at respective measurement sites using a first illumination; obtaining a second set of PPG signals from the plurality of detectors using a second illumination; obtaining at least two pairs of PPG signals, each pair comprising one PPG signal from the first set and one PPG signal from the second set, and for each pair, computing an artifact reference signal to obtain a candidate PPG signal; and choosing one of the candidate PPG signals as the artifact removed PPG signal.