The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2016
Filed:
Dec. 23, 2008
Applicants:
Assaf Govari, Haifa, IL;
Yaron Ephrath, Karkur, IL;
Andres Claudio Altmann, Haifa, IL;
Nahum Kilim, Haifa, IL;
Inventors:
Assaf Govari, Haifa, IL;
Yaron Ephrath, Karkur, IL;
Andres Claudio Altmann, Haifa, IL;
Nahum Kilim, Haifa, IL;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 18/14 (2006.01); A61B 5/05 (2006.01); A61B 5/06 (2006.01); A61B 5/00 (2006.01); A61B 19/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/06 (2013.01); A61B 5/6885 (2013.01); A61B 2019/5251 (2013.01);
Abstract
A method for displaying information includes receiving a measurement with respect to an invasive probe inside a body of a subject of at least one probe parameter, selected from a group of parameters consisting of a bend angle of the probe and a pressure on the probe. Responsively to the measurement, an icon is displayed on a display screen representing the at least one probe parameter for viewing by an operator of the probe.