The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2016

Filed:

Mar. 04, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Masahiro Kawanishi, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/60 (2006.01); H04N 1/028 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/02885 (2013.01); H04N 1/00005 (2013.01); H04N 1/00013 (2013.01); H04N 1/00037 (2013.01); H04N 1/00082 (2013.01); H04N 1/00997 (2013.01); H04N 1/0282 (2013.01); H04N 1/02895 (2013.01); H04N 2201/0081 (2013.01);
Abstract

A reading control apparatus that causes a reading apparatus including a light source and a sensor configured to receive light reflected by an original, to read the original, executes control for changing the irradiation angle of the light source with respect to the original. The control is executed to change the irradiation angle for one light source. Read images of the original corresponding to respective changed irradiation angles are acquired based on reflected beams that correspond to the respective irradiation angles and have been received by the sensor. The region of a correction target on the original is detected based on the acquired read images.


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