The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2016

Filed:

Sep. 08, 2014
Applicant:

Thales, Neuilly sur Seine, FR;

Inventor:

Dominique Heurguier, Gennevilliers, FR;

Assignee:

THALES, Neuilly sur Seine, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H04L 1/00 (2006.01); G01S 5/20 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0084 (2013.01); G01S 5/20 (2013.01);
Abstract

A method for characterizing at least one signal source is disclosed. In one aspect, the method includes measuring, from a set of sensors, a set of technical data specific to the signals emitted by the signal source, grouping together the technical data in a set of classes depending on the correlations on the data and characterizing the signal source from technical data having been grouped together. The grouping step includes calculating correlations on the data n-tuples with n>2 and calculating a global partitioning error for different distributions of the data in classes. The global partitioning error is defined as a sum of the partitioning costs for all the n-tuples. The grouping further includes retaining as a grouping of data, the distribution in the classes minimizing the global partitioning error.


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