The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Jul. 20, 2012
Christian Volf Olgaard, Saratoga, CA (US);
Jonathan Barry Hirst, Sunnyvale, CA (US);
Wing Hung Lee, Saratoga, CA (US);
Christian Volf Olgaard, Saratoga, CA (US);
Jonathan Barry Hirst, Sunnyvale, CA (US);
Wing Hung Lee, Saratoga, CA (US);
LITEPOINT CORPORATION, Sunnyvale, CA (US);
Abstract
A system and method for facilitating comparison of radio frequency (RF) data signals transmitted by a device under test (DUT) and received by a test system. A RF data signal received from a DUT is analyzed to provide analysis data indicative of conformance of the DUT operation with one or more applicable signal standards. The RF data signal is also converted to related conversion data that can be stored with state machine data corresponding to states of the signal testing subsystem. This state machine data can then be processed as needed with the analysis data and conversion data for off-line tasks such as debugging new test programs and procedures.