The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2016

Filed:

Feb. 11, 2014
Applicant:

Silicon Laboratories Inc., Austin, TX (US);

Inventors:

Jeremy C. Smith, Austin, TX (US);

Anirudh Oberoi, Castle Green, SG;

William Moore, Austin, TX (US);

Michael Khazhinsky, Austin, TX (US);

Assignee:

Silicon Laboratories Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/47 (2006.01); H01L 27/02 (2006.01); H01L 29/861 (2006.01); H01L 29/06 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0248 (2013.01); H01L 27/0255 (2013.01); H01L 29/0649 (2013.01); H01L 29/8613 (2013.01);
Abstract

Diode circuit layout topologies and methods are disclosed that exhibit reduced lateral parasitic bipolar characteristics at lateral parasitic bipolar circuit emitter edges during ESD or other voltage events as compared to conventional circuit layout topologies. The disclosed diode circuit layout topologies may be implemented to recess parasitic emitter ends relative to surrounding well ties, for example, to reduce or substantially eliminate parasitic bipolar action at lateral emitter edges of the circuitry during ESD events so as to provide higher current threshold for device failure, allowing for smaller device area and/or improved ESD robustness for a given circuit device.


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