The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Mar. 10, 2014
General Electric Company, Schenectady, NY (US);
Paulo Ricardo Mendonca, Niskayuna, NY (US);
Dirk Ryan Padfield, Niskayuna, NY (US);
Chandan Kumar Mallappa Aladahalli, Bangalore, IN;
Shubao Liu, Niskayuna, NY (US);
Theresa Rose Broniak, Niskayuna, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
Systems and methods for determining parameters for image analysis are provided. One method includes obtaining ultrasound data of an object, generating an image of the object, and identifying a region of interest in the image. The method also includes determining a plurality of spatially varying parameters for image analysis of the region of interest using prior information for one or more objects of interest, including prior location information for the one or more objects of interest, and wherein the plurality of spatially varying parameters are determined for a plurality of sections of the region of interest and different for at least some of the plurality of sections. The method further includes using the plurality of spatially varying parameters for performing image analysis of the region of interest in the image to determine the location of the one or more objects of interest.