The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Dec. 08, 2012
Applicant:
Cornell University, Ithaca, NY (US);
Inventors:
Noah Snavely, Menlo Park, CA (US);
Daniel Huttenlocher, Trumansburg, NY (US);
Yungpeng Li, Zurich, CH;
Assignee:
Cornell University, Ithaca, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06F 17/30 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0044 (2013.01); G06F 17/30247 (2013.01); G06K 9/00664 (2013.01); G06T 7/0046 (2013.01); G06T 2200/04 (2013.01); G06T 2207/30244 (2013.01);
Abstract
System and methods for determining where a digital photograph was taken by estimating the camera pose with respect to a global scale three-dimensional database. Accurate location and orientation of the digital photograph is established through feature correspondence and geometry estimated from photograph collections.
Snavely, Noah. (2016). System and methods for world-scale camera pose estimation (U.S. Patent No. 9324151). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9324151
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile