The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2016

Filed:

Jun. 12, 2014
Applicant:

Htc Corporation, Taoyuan County, TW;

Inventors:

Ruey-Jer Chang, Taoyuan County, TW;

Lun-Cheng Chu, Taoyuan County, TW;

Wei-Chung Yang, Taoyuan County, TW;

Assignee:

HTC Corporation, Taoyuan, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/217 (2011.01); H04N 5/232 (2006.01); H04N 5/235 (2006.01); H04N 5/243 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 5/005 (2013.01); G06T 5/50 (2013.01); H04N 5/217 (2013.01); H04N 5/2351 (2013.01); H04N 5/23229 (2013.01); H04N 5/243 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/20172 (2013.01); G06T 2207/30168 (2013.01);
Abstract

A method, an electronic apparatus, and a computer readable medium for processing reflection in an image are proposed. In the method, a first image and a second image are obtained. A plurality of objects in the first image and the second image are recognized and a plurality of lighting regions having a brightness higher than a first threshold in the first image and the second image are detected. Then, a plurality of displacements between corresponding objects and corresponding lighting regions in the first image and the second image are calculated. It is determined whether a ratio of the displacement of the object nearby one of the lighting regions to the displacement of the lighting region is over a second threshold. Finally, the lighting region is determined as a reflection if the ratio is over the second threshold.


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