The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2016

Filed:

Sep. 14, 2012
Applicants:

Manish A. Bhide, New Delhi, IN;

Srinivas Kiran Mittapalli, Secunderabad, IN;

Sriram Padmanabhan, San Jose, CA (US);

Inventors:

Manish A. Bhide, New Delhi, IN;

Srinivas Kiran Mittapalli, Secunderabad, IN;

Sriram Padmanabhan, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30563 (2013.01); G06F 17/30589 (2013.01); G06F 17/30592 (2013.01);
Abstract

A computer-implemented method, computer program product and a system for supporting star and snowflake data schemas for use with an Extract, Transform, Load (ETL) process, comprising selecting a data source comprising dimensional data, where the dimensional data comprises at least one source table comprising at least one source column, importing a data model for the dimensional data into a data integration system, analyzing the imported data model to select a star or snowflake target data schema comprising target dimensions and target facts, generating a meta-model representation by mapping at least one source table or source column to each target fact and target dimension, automatically converting the meta-model representation into one or more ETL jobs, and executing the ETL jobs to extract the dimensional data from the data source and loading the dimensional data into the selected target data schema in a target data system.


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