The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2016

Filed:

Apr. 05, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Marik Marshak, Newton, MA (US);

Alexandr Veprinsky, Brookline, MA (US);

Stephen Richard Ives, West Boylston, MA (US);

Arieh Don, Newton, MA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 12/08 (2016.01); G06F 13/00 (2006.01); G06F 13/28 (2006.01); G06F 12/12 (2016.01);
U.S. Cl.
CPC ...
G06F 12/0866 (2013.01); G06F 12/0871 (2013.01); G06F 12/121 (2013.01);
Abstract

A system and techniques are provided for evaluating front end activity of a storage device in connection with storage tiering and management operations at the back end without the need to collect new sub-LUN metrics/statistics on the front end or querying the front end. The system avoids demotions of extents that are hot on the front end even when seemingly cool on the back end. The result is improved system performance since data that is hot on the front end will not be demoted to a lower storage tier. The system provides that there is little to no additional performance impact on the front end because there is no requirement to collect any new front end statistics or query the front end, and there is no increase in the meta data collected by the automated tiering system as there is no new sub-LUN metrics collected on the front end.


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