The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Jun. 07, 2012
Jane H. Bartik, Poughkeepsie, NY (US);
Michael Billeci, Poughkeepsie, NY (US);
Lisa C. Heller, Rhinebeck, NY (US);
Donald G. O'brien, Poughkeepsie, NY (US);
Bruce A. Wagar, Tempe, AZ (US);
Patrick M. West, Jr., Hyde Park, NY (US);
Jane H. Bartik, Poughkeepsie, NY (US);
Michael Billeci, Poughkeepsie, NY (US);
Lisa C. Heller, Rhinebeck, NY (US);
Donald G. O'Brien, Poughkeepsie, NY (US);
Bruce A. Wagar, Tempe, AZ (US);
Patrick M. West, Jr., Hyde Park, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Disclosed are a method and system for measuring the performance of individual logical partitions of a logically partitioned computer system. Preferably, the method and system both hardware and firmware to allow measurement samples to be collected only for user specified zones of interest. In one embodiment, the method comprises the steps of specifying a Zone or Zones of interest (a Zone being a logical partition), collecting measurement samples only from the one or more specified Zones of interest, and measuring the performance of each of these Zones using only the measurement samples collected from said each of the Zones.