The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Mar. 06, 2014
International Business Machines Corporation, Armonk, NY (US);
Dale H. Anderson, Tucson, AZ (US);
Joshua J. Crawford, Tucson, AZ (US);
Paul A. Jennas, II, Tucson, AZ (US);
Jason L. Peipelman, Vail, AZ (US);
Matthew J. Ward, Vail, AZ (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for dynamic monitoring of command line queries. The method includes receiving a command that includes a query and one or more parameters, mapping the command to a system resource, monitoring for a state change event pertaining to the system resource or a terminal event until a detection of the terminal event, and retrieving one or more characteristics of the system resource in response to detecting the state change event pertaining to the system resource. The system resource has a plurality of characteristics, each characteristic having a name and a value. A state change event corresponds to a change in one or more characteristics of a system resource.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile