The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
May. 09, 2013
Deja VU Security, Llc, Seattle, WA (US);
Michael Eddington, Seattle, WA (US);
PEACH FUZZER LLC, Seattle, WA (US);
Abstract
Flow based fault testing is provided. A logical constraint model or a state model (LS model) can be generated based on logic/state characteristics of a system under test (SUT). The LS model can be generated from logical constraint grammar statements. The logical constraint grammar can be parsed as part of a pre-test analysis to seek faults related to the logic or states of the model. The inputs and outputs related to the SUT can be employed to determine faults, including post-test analysis for faults. The disclosed subject matter can capture in an automated or semi-automated manner faults that can be missed in more conventional fuzz testing. Further, flow based fault testing can be employed alone, along with, or in combination with conventional fuzz testing.