The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Dec. 30, 2014
Applicant:
SK Hynix Inc., Icheon-si Gyeonggi-do, KR;
Inventors:
Sang Hoon Shin, Icheon-si, KR;
Tae Yong Lee, Icheon-si, KR;
Assignee:
SK Hynix Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2014.01); H01L 21/66 (2006.01); G01R 31/3185 (2006.01); G01R 31/28 (2006.01); G01R 31/30 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2607 (2013.01); G01R 31/2853 (2013.01); G01R 31/3008 (2013.01); G01R 31/318513 (2013.01); H01L 22/30 (2013.01); H01L 22/34 (2013.01); H01L 24/16 (2013.01); H01L 2224/16145 (2013.01); H01L 2924/00014 (2013.01);
Abstract
A test circuit of a semiconductor integrated circuit includes a through via, a voltage driving unit, and a determination unit. The through via is charged by receiving an input voltage. The voltage driving unit generates a test voltage by charging or discharging the through via in response to a test control signal. The determination unit compares levels of the input voltage and the test voltage and outputs a resultant signal.