The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Aug. 09, 2012
Applicants:
Akio Kuroda, Hiroshima, JP;
Takenori Ishida, Hiroshima, JP;
Tomoki Nishimura, Hiroshima, JP;
Inventors:
Assignee:
Hiroshima University, Hiroshima, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C07K 1/13 (2006.01); G01N 33/53 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5308 (2013.01); G01N 21/6428 (2013.01); G01N 21/6458 (2013.01);
Abstract
In order to provide a method for more efficiently, easily, and accurately detecting asbestos without changing the asbestos detection criterion of the phase-contrast microscope/electron microscope method as compared with the phase-contrast microscope/electron microscope method, a phase-contrast microscope and a fluorescence microscope are used in combination to detect asbestos contained in a test sample after the test sample is made contact with an asbestos-binding protein having a fluorescent label.