The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Nov. 19, 2012
Applicant:
Alltech Associates, Inc., Columbia, MD (US);
Inventors:
James Anderson, Jr., Arlington Heights, IL (US);
Raaidah Saari-Nordhaus, Antioch, IL (US);
Washington Mendoza, Lake in the Hills, IL (US);
Josef Bystron, Chicago, IL (US);
Romulus Gaita, Des Plaines, IL (US);
Assignee:
Alltech Associates, Inc., Columbia, MD (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); C22C 38/00 (2006.01); G01N 30/02 (2006.01); G01N 1/00 (2006.01); G01N 30/00 (2006.01); G01N 33/00 (2006.01); G01N 35/00 (2006.01); B01D 15/08 (2006.01); G01N 30/80 (2006.01); G01N 30/46 (2006.01); G01N 30/88 (2006.01); G01N 30/86 (2006.01); G01N 30/74 (2006.01); G01N 30/82 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
G01N 30/80 (2013.01); G01N 30/461 (2013.01); G01N 30/72 (2013.01); G01N 30/74 (2013.01); G01N 30/82 (2013.01); G01N 30/8682 (2013.01); G01N 30/88 (2013.01);
Abstract
Methods and apparatus for analyzing a sample using at least one detector are disclosed.