The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Nov. 29, 2011
George M. Whitesides, Cambridge, MA (US);
Audrey Ellerbee, Stanton, CA (US);
Simon Tricard, Cambridge, MA (US);
George M. Whitesides, Cambridge, MA (US);
Audrey Ellerbee, Stanton, CA (US);
Simon Tricard, Cambridge, MA (US);
President and Fellows of Harvard College, Cambridge, MA (US);
Abstract
The ability to levitate and detect height and orientation of diamagnetic objects suspended in paramagnetic solutions using an inhomogeneous magnetic field is described. By comparing the measured height and orientation of a sample material with the measured height and orientation of a reference material, quality control of objects can be carried out. The major advantages of this quality control technique are: i) it is a simple apparatus that does not require electric power (a set of permanent magnets and gravity are sufficient for the diamagnetic separation and collection system to work); ii) it is compatible with simple optical detection; iii) it is a cost-effective and simple method that can carry out quality control between sample and reference materials rapidly.