The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Aug. 29, 2013
Phase Focus Limited, Sheffield, GB;
Martin James Humphry, Nottingham, GB;
Andrew Maiden, Sheffield, GB;
PHASE FOCUS LIMITED, Sheffield, GB;
Abstract
Embodiments of the present invention provide a method of estimating a magnitude of background radiation for each of a plurality of regions of a target object comprising providing an estimate of background radiation detected by a detector, measuring radiation scattered by the target object at the detector for each of a plurality of positions of the object with respect to the incident radiation, calculating, for each of the positions, an estimate of a wavefront at the detector, and determining, for each position, an estimated wavefront comprising a coherent contribution from radiation scattered by the target object and a background contribution, wherein said background contribution is at least partly incoherent with the radiation scattered by the target object. This method is particularly suitable for performing coherent diffractive imaging using ptychography where contribution from the incoherently scattered background is taken into account.