The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Feb. 10, 2012
Yoshio Takami, Kyoto, JP;
Yoshio Takami, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
An inspection apparatusfor solar cellsincludes: a visible light sourceadapted to irradiate visible light; a CCD cameraadapted to measure a reflection image based on the visible light reflected by an antireflective film of a solar cell; an infrared light sourceadapted to irradiate the solar cellwith infrared light; and a CCD cameraadapted to measure a transmission image based on the infrared light transmitting through the solar cell. In the inspection apparatus, as a result of comparing the reflection image and the transmission image with each other, of areas respectively appearing as bright spots in the reflection image, an area appearing as a dark spot in the transmission image is determined as an area including a particle, whereas of the areas respectively appearing as the bright spots in the reflection image, an area other than the area determined as the area including the particle is determined as an area including a pinhole.