The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2016

Filed:

Oct. 29, 2012
Applicant:

Tokitae Llc, Bellevue, WA (US);

Inventors:

Michael C. Hegg, Seattle, WA (US);

Benjamin K. Wilson, Kirkland, WA (US);

Assignee:

Tokitae LLC, Bellevue, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 21/51 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/474 (2013.01); G01N 21/51 (2013.01); G06K 9/00127 (2013.01);
Abstract

Systems, devices, and methods are described for identifying, classifying, differentiating, etc., objects. For example a hyperspectral imaging system can include a dark-field module operably coupled to at least one of an optical assembly, a dark-field illuminator, and a hyperspectral imaging module. The dark-field module can include circuitry having one or more sensors operable to acquire one or more dark-field micrographs associated with scattered electromagnetic energy from an object interrogated by the dark-field interrogation stimulus. The hyperspectral imaging module can be operably coupled to the dark-field module, and can include circuitry configured to generate an angular-resolved and spectrally resolved scattering matrix based on the one or more dark-field micrographs of the object.


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