The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2016

Filed:

Jun. 03, 2014
Applicant:

Endress + Hauser Conducta Gesellschaft Für Mess—und Regeltechnik Mbh + Co. KG, Gerlingen, DE;

Inventors:

Peter Lindmuller, Essingen, DE;

Matthias Grossmann, Vaihingen-Enz, DE;

Thilo Kratschmer, Gerlingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/27 (2006.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
G01N 21/278 (2013.01); G01N 21/8507 (2013.01); G01N 2021/8535 (2013.01);
Abstract

A method for adjusting, calibrating and/or checking a function of a photometric sensor, which is embodied for measuring at least one measured variable in a medium, wherein the sensor works with at least one measuring wavelength and at least one reference wavelength, comprising the steps as follows: mounting a calibration insert in a receptacle provided therefor at the sensor, adjusting, calibrating and/or performing the function check, and removing the calibration insert, characterized in that the transmittance of light of the measuring wavelength and the transmittance of light of the reference wavelength through the calibration insert are different. The invention relates further to a calibration insert.


Find Patent Forward Citations

Loading…