The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Jun. 19, 2014
Robert R. Alfano, New York, NY (US);
Yang Pu, New York, NY (US);
Wubao Wang, Flushing, NY (US);
Other;
Abstract
A method detects the degree of spoilage of food by exposing a food sample to an excitation wave having a first wavelength of about 340 nm or about 380 nm, wherein the excitation wave has a bandwidth of 40 nm or less. The excitation wave is permitted to interact with the food sample and return emission spectra. A detector detects the emission spectra. A predetermined threshold value is established which defines when a food sample is or is not spoiled. The emission spectra is analyzed at a second wavelength of about 400 nm, about 450 nm or about 530 nm to provide a test or measured value of the emission spectra indicative of the degree of spoilage of the food sample. Whether or not a food sample is spoiled beyond the predetermined threshold is determined by comparing the measured value to the predetermined threshold value.