The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Dec. 03, 2013
Applicants:
Stylianos Papadimitriou, Houston, TX (US);
Wanda Papadimitirou, Houston, TX (US);
Inventors:
Stylianos Papadimitriou, Houston, TX (US);
Wanda Papadimitirou, Houston, TX (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 5/00 (2006.01); G01B 5/00 (2006.01); G01N 19/00 (2006.01); G01B 5/14 (2006.01); G10L 15/22 (2006.01);
U.S. Cl.
CPC ...
G01N 19/00 (2013.01); G01B 5/00 (2013.01); G01B 5/14 (2013.01); G01M 5/0033 (2013.01); G10L 15/22 (2013.01);
Abstract
Autonomous non-destructive inspection equipment provides automatic and/or continuous inspection and evaluation of a material under inspection. The inspection equipment comprises at least one detection sensor and at least one detection sensor interface for a computer. The signals are communicated from the sensor to the computer. The signals are then conditioned and evaluated according to knowledge already inputted into the computer. The computer iterations are processed until an acceptable conclusion is made regarding the type of imperfection that is detected.