The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Mar. 27, 2014
Nidek Co., Ltd., Aichi, JP;
Motoshi Tanaka, Aichi, JP;
NIDEK CO., LTD., Aichi, JP;
Abstract
An eyeglass lens measuring apparatus includes a measuring optical system configured to measure optical properties of an eyeglass lens for the right eye and optical properties of an eyeglass lens for the left eye; and a point marking mechanism including a first point marking member configured to provide a first mark point defining an optical center and an astigmatic axis of the eyeglass lens which are acquired by using the measuring optical system, and a second point marking member configured to provide a second mark point defining an upper portion and a lower portion of the eyeglass lens, wherein the point marking mechanism is configured to provide the eyeglass lens for the right eye and the eyeglass lens for the left eye respectively with the second mark points almost the same in position.