The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2016

Filed:

Sep. 28, 2012
Applicants:

David Grodzki, Erlangen, DE;

Bjoern Heismann, Erlangen, DE;

Sebastian Schmidt, Weisendorf, DE;

Inventors:

David Grodzki, Erlangen, DE;

Bjoern Heismann, Erlangen, DE;

Sebastian Schmidt, Weisendorf, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/06 (2006.01); G01R 33/28 (2006.01); G01R 33/48 (2006.01); A61B 19/00 (2006.01); A61B 5/055 (2006.01);
U.S. Cl.
CPC ...
A61B 5/062 (2013.01); A61B 19/5244 (2013.01); G01R 33/286 (2013.01); G01R 33/4816 (2013.01); A61B 5/055 (2013.01); A61B 2019/5236 (2013.01); A61B 2019/5265 (2013.01); G01R 33/4824 (2013.01);
Abstract

In a magnetic resonance (MR) method and system to generate a series of MR images to monitor the position of an interventional device located in an examination region, radial scanning of k-space is combined with other scans, in particular for the k-space center. The measurement time until the entirety of k-space corresponding to the imaging region is scanned is thereby markedly shortened in total. The short echo times that are possible with this reduce susceptibility artifacts in the reconstructed image data and enable a depiction of tissue or substances with very short T2 values, for example plastics. Due to the rapidly repeated excitation and acquisition of measurement data and the reconstruction of image data, it is possible to monitor a position of the intervention device in the examination region.


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