The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2016

Filed:

Mar. 31, 2010
Applicant:

David A. Luce, Clarence Center, NY (US);

Inventor:

David A. Luce, Clarence Center, NY (US);

Assignee:

Reichert, Inc., Depew, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/16 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/165 (2013.01); A61B 3/0025 (2013.01);
Abstract

In an ophthalmic instrument that directs a fluid pulse at a cornea to cause reversible deformation of the cornea and monitors the corneal deformation to generate a deformation signal, the shape of the deformation signal is analyzed with respect to deformation signal data from a statistical population of eyes to calculate a deformation signal score indicating a degree of probability that the deformation signal corresponds in shape to a normal deformation signal for normal eyes in the population. In calculating the deformation signal score, significant geometrical signal parameters are calculated and combined. The deformation signal score may be used as a basis to keep or discard intraocular pressure measurements in a non-contact tonometer, and/or as a basis to conduct further diagnostic screening.


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