The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Oct. 29, 2013
Applicant:

Industrial Technology Research Institute, Chutung, Hsinchu, TW;

Inventors:

Yu-Chen Lin, Taipei, TW;

Wei-Cheng Liu, Miaoli, TW;

Shao-Yuan Lee, Jinsha Township, Kinmen County, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); B60R 1/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); B60R 1/00 (2013.01); G06T 7/0018 (2013.01); B60R 2300/402 (2013.01);
Abstract

An image conversion method is provided. An image of a calibration reference pattern is captured. A plurality of first and a plurality of second characteristic patterns of the calibration reference pattern are identified. Coordinates of the first and second characteristic patterns in a first view angle coordinate system are obtained, and coordinates of the first and second characteristic patterns in a second view angle coordinate system are obtained, to obtain a coordinate conversion relationship between the first and second view angle coordinate systems. An input image is converted to an output image according to the coordinate conversion relationship.


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