The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Apr. 09, 2013
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Shintaro Eda, Tokyo, JP;

Kengo Oketani, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/10 (2006.01); H04B 17/00 (2015.01); H04L 25/02 (2006.01); H04L 25/03 (2006.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04B 1/1027 (2013.01); H04B 17/00 (2013.01); H04L 25/022 (2013.01); H04L 25/0202 (2013.01); H04L 25/0204 (2013.01); H04L 25/03159 (2013.01); H04L 27/2647 (2013.01); H04L 2025/03414 (2013.01); H04L 2025/03636 (2013.01);
Abstract

A reception quality measuring apparatus () including: an equalizing processing unit () for performing an equalizing process on a reception signal to derive an equalized reception signal; lattice distance estimating element () for deriving a lattice distance estimation value using the equalized reception signal; an RSSI estimating unit () for deriving an RSSI estimation value using the lattice distance estimation value; an ISSI estimating unit () for deriving an ISSI estimation value by subtracting the RSSI estimation value from the lattice distance estimation value; and a dividing unit () for deriving an SIR representing reception quality by dividing the RSSI estimation value by the ISSI estimation value.


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