The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Mar. 31, 2014
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventor:

Satoru Momose, Atsugi, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 31/00 (2006.01); H01L 51/42 (2006.01); H01L 51/00 (2006.01); B82Y 10/00 (2011.01);
U.S. Cl.
CPC ...
H01L 51/4273 (2013.01); B82Y 10/00 (2013.01); H01L 51/0003 (2013.01); H01L 51/0036 (2013.01); H01L 51/0039 (2013.01); H01L 51/0043 (2013.01); H01L 51/0047 (2013.01); H01L 51/4253 (2013.01); H01L 2251/308 (2013.01); Y02E 10/549 (2013.01); Y02P 70/521 (2015.11);
Abstract

Provided is a photoelectric conversion device which includes a positive electrode, a negative electrode, a photoelectric conversion layer including poly-[N-9″-heptadecanyl-2,7-carbazole-alt-5,5-(4',7′-di-2-thienyl-2′,1′,3′-benzothiadiazole)] as a p-type organic semiconductor material and fullerene or a fullerene derivative as an n-type organic semiconductor material; and a buffer layer, provided between the positive electrode and the photoelectric conversion layer, including MoO, in which device the proportion of the p-type organic semiconductor material in a first region being in contact with the buffer layer in the photoelectric conversion layer is higher than the proportion of the p-type organic semiconductor material in the entirety of the photoelectric conversion layer, and the proportion of the p-type organic semiconductor material in a second region on the negative electrode side than the first region in the photoelectric conversion layer is lower than the proportion of the p-type organic semiconductor material in the entirety of the photoelectric conversion layer.


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