The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Mar. 24, 2014
Applicant:

Ev Products, Inc., Saxonburg, PA (US);

Inventors:

Handong Li, Pittsburgh, PA (US);

Michael Prokesch, Gibsonia, PA (US);

John F. Eger, Bentleyville, PA (US);

Assignee:

eV Products, Inc., Saxonberg, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/0224 (2006.01); H01L 27/146 (2006.01); H01L 31/08 (2006.01); H01L 31/18 (2006.01);
U.S. Cl.
CPC ...
H01L 31/022408 (2013.01); H01L 27/14696 (2013.01); H01L 31/085 (2013.01); H01L 31/1828 (2013.01); H01L 27/14676 (2013.01); Y02E 10/543 (2013.01);
Abstract

A semiconductor radiation detector having a semiconductor substrate and first and second metal layers. The semiconductor substrate has substantially planar upper and lower opposing surfaces which have respective first and second surface areas. The first and second surface areas are defined by prospective dice lines. The first metal layer is on the substantially planar upper surface such that the first metal layer will have a surface area less than the first surface area of the substantially planar upper surface as defined by spaces on the substantially planar upper surface between the first metal layer and the prospective dice lines which define the first surface area. The second metal layer is on the substantially planar lower opposing surface.


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