The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Jan. 29, 2013
Applicant:

Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;

Inventors:

Atsushi Miyamoto, Kokubunji, JP;

Junichi Miyakoshi, Kokubunji, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0014 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30004 (2013.01); G06T 2207/30096 (2013.01);
Abstract

An apparatus for medical diagnostic imaging assistance includes memory that stores first feature information representing the feature of a lesion mask or non-lesion mask, a sampling unit that acquires a plurality of samples by making sampling form the memory based on the first feature information, a machine-learning unit that generates a first discrimination condition corresponding to each of samples by carrying out a machine-learning step on the multiple samples, and a statistical processing unit that generates a second discrimination condition by carrying out a statistical processing step under the first discrimination condition, in which a detection function determines whether a lesion candidate mask is an actual lesion by referring to second feature information representing the feature of a lesion candidate mask under a second discrimination condition.


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