The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Mar. 17, 2015
Tadashi Kitai, Kanagawa, JP;
Tadashi Kitai, Kanagawa, JP;
RICOH COMPANY, LIMITED, Tokyo, JP;
Abstract
An image inspecting device includes: an image inspection unit that inspects a read image obtained by reading an image formed by an image formation output, based on threshold information including one or more types of thresholds and a difference image indicating a difference between the read image and a reference image generated based on print data of the image formation output, and specifies a defect portion; and a screen information generation unit that generates and outputs threshold adjustment screen information including a threshold image indicating each value of the thresholds and an inspection result image indicating an inspection result of the defect portion, and threshold adjustment result screen information including a threshold image and a reinspection result image using adjusted threshold information; and a threshold information changing unit that changes the threshold information to the adjusted threshold information based on a threshold information change input.